Enhancing the Fatigue Life of PCB Assemblies through Strategic Positioning and Novel Support Techniques for BGA Packages

Muthuram Nehruji, Saravanan Sambasivam, Saravanakumar Krishnasamy, Arjun Nithyanandhan

Abstract


The fatigue life of solder balls in Ball Grid Array (BGA) packages of a Printed Circuit Board (PCB) assembly is a key factor that influences the reliability of electronic devices. This study explores three novel methods to enhance the fatigue life of the PCB assembly with BGA packages, focusing on stress reduction techniques in solder balls under random vibration. The numerical analysis of the PCB assembly examined stress distributions and identified optimal design strategies to improve resistance to fatigue under random vibration. The findings demonstrate that strategic positioning of BGA packages, the use of additional supports, and modifications to PCB assembly can significantly reduce stress on solder balls, thus extending their fatigue life 8 to 10 times that of the existing design.


Keywords


Fatigue Life, Ball Grid Array (BGA) packages, PCB, Reliability, Optimal design, Random Vibration

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References


M. Li, C. -y. Huang, Z. Wang and W. Wei, "Stress-strain study of QFN solder joints with different structural parameters under random vibration loading," 2021 22nd International Conference on Electronic Packaging Technology (ICEPT), Xiamen, China, 2021, pp. 1-5, doi: 10.1109/ICEPT52650.2021.9568203.

Apalowo, R. K., Abas, M. A., Muhamed Mukhtar, M. A. F., Che Ani, F. & Ramli, M. R. Investigation of the impacts of solder alloy composition and temperature profile on fatigue life of BGA solder joints under accelerated thermal cycling. Journal of Electronic Packaging. Vol. 147 No 1, pp. 011005. https://doi.org/10.1115/1.4065805.

Gharaibeh, M.A. A simulation-based study on the effect of package parameters on the random vibration behavior of electronic packages. Eur. Phys. J. Plus 136, 1132 (2021). https://doi.org/10.1140/epjp/s13360-021-02102-7

Doranga, S., Ferdowsi, S. B., Li, Y., & Khanal, M. (2024). A novel approach of fatigue testing and evaluation of electronic systems based on phase tracking. Microelectronics Reliability, 155, 115368. https://doi.org/10.1016/j.microrel.2024.115368

Apalowo, R. K., Abas, M. A., Che Ani, F., Muhamed Mukhtar, M. A. F., & Ramli, M. R. (2024). Thermal fatigue life prediction and intermetallic compound behaviour of SAC305 BGA solder joints subject to accelerated thermal cycling test. Soldering & Surface Mount Technology. Vol. 36 No. 3, pp. 154-164. https://doi.org/10.1108/SSMT-12-2023-0075.

Park, T. Y., Park, J. H., & Oh, H. U. (2023). Experimental evaluation of vibrational stability of SOPs in aerospace industry using PCB strain effectiveness of a PCB-strain-based design methodology. Aerospace, 10(6), 516. https://doi.org/10.3390/aerospace10060516

Mohammad A. Gharaibeh, James M. Pitarresi, Random vibration fatigue life analysis of electronic packages by analytical solutions and Taguchi method, Microelectronics Reliability, Volume 102, 2019, 113475, ISSN0026-2714; https://doi.org/10.1016/j.microrel.2019.113475.

D. Liang, Q. Wu, D. Ghaderi and J. M. Guerrero, "Analysis of Multilayered Power Module Packaging Behavior Under Random Vibrations," in IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 10, no. 10, pp. 1700-1707, Oct. 2020, doi: 10.1109/TCPMT.2020.2995735

F. Wang, F. Zhang, Q. Huang, and M. Salmani, “An investigation on mechanical random vibration fatigue damage of solder joints in electronic systems,” Soldering & Surface Mount Technology, vol. 33, no. 3, pp. 170–177, 2021, Accessed: Sep. 28, 2023. https:///doi/10.1108/SSMT-07-2020-0031

Y. Gao, F. Wang, S. Ding, B. Yang, L. Liu, and M. Salmani, “Device architecture optimization of solder ball joints fatigue lifetime under random vibration frequencies,” Soldering & Surface Mount Technology, vol. 33, no. 1, pp. 1–7, 2021. https://doi.org/10.1108/SSMT-05-2020-0020

P. Yang, X. Tang, Y. Liu, S. Wang, and J. Yang, “Dynamic reliability approach of chip scale package assembly under vibration environment,” Microelectronics International, vol. 31, no. 2, pp. 71–77, 2014. https://doi.org/10.1108/MI-11-2013-0061

Mohammad A. Gharaibeh, A numerical study on the effect of the fixation methods on the vibration fatigue of electronic packages, Microelectronics Reliability, Volume 115, 2020, 113967, ISSN 0026-2714, https://doi.org/10.1016/j.microrel.2020.113967.

Yu, Da, Abdullah Al-Yafawi, Tung T. Nguyen, Seungbae Park, and Soonwan Chung. "High-cycle fatigue life prediction for Pb-free BGA under random vibration loading." Microelectronics Reliability 51, no. 3 (2011): 649-656. https://doi.org/10.1016/j.microrel.2010.10.003

Tang Wei, Jing Bo, Huang Yifeng, et al., “Multistate Degradation Model for Prognostics of Solder Joints Under Vibration Conditions,” Chinese Journal of Electronics, vol. 25, no. 4, pp. 779-785, 2016, doi: 10.1049/cje.2016.07.012

Karthiheyan, S.G.S., Verma, V.K., Saravanan, S. et al. Dynamic Response Characteristics and Fatigue Life Prediction of Printed Circuit Boards for Random Vibration Environments. J Fail. Anal. and Preven. 20, 920–929 (2020). https://doi.org/10.1007/s11668-020-00895-w

P.H. Wirsching, M.C. Light, Fatigue under wide band random stresses. J. Struct. Div. 106(7), 1593–1607 (1980).

C.E. Larsen, L.D. Lutes, Predicting the fatigue life of offshore structures by the single-moment spectral method. Stoch. Struct. Dyn. 2, 91–120 (1991)

JEDEC Standard JESD22-B111, “Board Level Drop Test Method of Components for Handheld Electronic products”, JEDEC Solid State Technology Assoc, 2003.




DOI: https://doi.org/10.33180/InfMIDEM2026.103

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