huang, xiaoguang, China University of Petroleum(East China), China
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Vol 49, No 2 (2019) - Technologies and Materials
Simulation on interfacial singular stress-strain induced cracking of microelectronic chip under power on-off cycles
Abstract PDF -
Vol 50, No 1 (2020) - Electronics
BP neural network in predicting thermal fatigue life of microelectronic chip
Abstract PDF
ISSN: 2232-6979